デバイス動作下硬X線光電子分光法による最先端材料の物性解明
(Bias-application in hard x-ray photoelectronic study for advanced materials)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 16:25:15 +0900Updated at: 2024-04-01 18:26:53 +0900