Influence of adsorbed oxygen concentration on characteristics of carbon-doped indium oxide thin-film transistors under bias stress
Author(s) | Riku Kobayashi, Toshihide Nabatame, Takashi Onaya, Akihiko Ohi, Naoki Ikeda, Takahiro Nagata, Kazuhito Tsukagoshi, Atsushi Ogura. |
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Journal title | Japanese Journal of Applied Physics 60 [SC] SCCM01 ISSN: 13474065, 00214922 ESI category: PHYSICS |
Publisher | IOP Publishing |
Year of publication | 2021 |
Language | English |
DOI | https://doi.org/10.35848/1347-4065/abe685 |
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