Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements

Marcel Schloz; Thomas C Pekin; Hamish G Brown; Dana O Byrne; Bryan D Esser; Emmanuel Terzoudis-Lumsden; Takashi Taniguchi; Kenji Watanabe; Scott D Findlay; Benedikt Haas; Jim Ciston; Christoph T Koch; Marcel Schloz; Thomas C Pekin; Hamish G Brown; Dana O Byrne; Bryan D Esser; Emmanuel Terzoudis-Lumsden; Takashi Taniguchi; Kenji Watanabe; Scott D Findlay; Benedikt Haas; Jim Ciston; Christoph T Koch

doi:10.1093/mam/ozae110

Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements

Marcel Schloz, Thomas C Pekin, Hamish G Brown, Dana O Byrne, Bryan D Esser, Emmanuel Terzoudis-Lumsden, Takashi Taniguchi, Kenji Watanabe, Scott D Findlay, Benedikt Haas, Jim Ciston, Christoph T Koch.

Microscopy and Microanalysis 31 [1] ozae110. 2025.

https://doi.org/10.1093/mam/ozae110

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2025-04-15 03:06:42 +0900 Updated at: 2026-10-03 07:06:47 +0900