Evaluation of potential variations around grain boundaries in BaSi2 epitaxial films by Kelvin probe force microscopy
(ケルビンプローブフォース顕微鏡によるBaSi2エピ膜の粒界ポテンシャル評価)
NIMS author(s)
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Created at: 2016-05-24 17:14:25 +0900Updated at: 2024-03-31 11:47:26 +0900