HOME > Article > DetailThe g-values of defects in hydrogenated microcrystalline siliconK. Morigaki, C. Niikura. Solid State Communications 136 [5] 308-312. 2005.https://doi.org/10.1016/j.ssc.2005.08.001 NIMS author(s)NIIKURA, ChisatoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 14:48:16 +0900Updated at: 2025-03-13 05:25:52 +0900