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AuthorR. Yamamoto, K. Sakai, K. Maehisa, K. Nagayoshi, T. Hayashi, H. Muramatsu, Y. Nakashima, K. Mitsuda, N. Y. Yamasaki, Y. Takei, M. Hidaka, S. Nagasawa, K. Maehata, T. Hara.
TitleCommon Bias Readout for TES Array on Scanning Transmission Electron Microscope
Journal titleJournal of Low Temperature Physics 184 1-2 454 459
ISSN: 15737357 00222291
Year of publication2016
LanguageEnglish
DOI10.1007/s10909-016-1562-4
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