HOME > Article > DetailZnO low-dimensional structures: electrical properties measured inside a transmission electron microscope(ZnO低次元構造:電気特性の透過電子顕微鏡内での測定)Pedro M. F. J. Costa, Dmitri Golberg, Guozhen Shen, Masanori Mitome, Yoshio Bando. Journal of Materials Science 43 [4] 1460-1470. 2008.https://doi.org/10.1007/s10853-007-2307-1 NIMS author(s)GOLBERG, DmitriMITOME, MasanoriBANDO, YoshioFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:35:57 +0900Updated at: 2024-04-01 19:13:29 +0900