HOME > Article > DetailExpanding a polarized synchrotron beam for full-field x-ray fluorescence imagingWenyang Zhao, Keiichi Hirano, Kenji Sakurai. Review of Scientific Instruments 90 [11] 113704. 2019.https://doi.org/10.1063/1.5115421 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-11-27 03:00:18 +0900 Updated at: 2025-10-18 04:48:54 +0900
