HOME > 論文 > 書誌詳細Defect Characterization in Silicon by Electron-Beam-Induced Current and Cathodoluminescence TechniquesSEKIGUCHI, Takashi, CHEN, Jun. Defects and Impurities in Silicon Materials: An Introduction to Atomic-Level Silicon Engineering 946 343-373. 2016.NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-12-09 20:10:14 +0900更新時刻: 2018-06-15 22:24:34 +0900
