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Device size dependence of resistance switching performance in metal/manganite/metal trilayers

G. Sugano, I. Ohkubo, T. Harada, T. Ohnishi, M. Lippmaa, Y. Matsumoto, H. Koinuma, M. Oshima.
Materials Science and Engineering: B 173 [1-3] 3-6. 2010.
https://doi.org/10.1016/j.mseb.2009.11.022

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