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Depairing current density of Ba0.5K0.5Fe1.95Co0.05As2 microbridges with nanoscale thickness

Jun Li, Jie Yuan, Jun-Yi Ge, Min Ji, Hai-Luke Feng, Ya-Hua Yuan, Takeshi Hatano, Johan Vanacken, Kazunari Yamaura, Hua-Bing Wang, Eiji Takayama-Muromachi, Victor V. Moshchalkov.

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Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at :2016-05-24 17:49:51 +0900 Updated at :2022-10-22 02:19:24 +0900

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