HOME > Article > DetailMaximum a posteriori estimation for high-throughput peak fitting in X-ray photoelectron spectroscopyTarojiro Matsumura, Naoka Nagamura, Shotaro Akaho, Kenji Nagata, Yasunobu Ando. Science and Technology of Advanced Materials: Methods 4 [1] 2373046. 2024.https://doi.org/10.1080/27660400.2024.2373046 Open Access Informa UK Limited (Publisher) NIMS author(s)NAGAMURA, NaokaNAGATA, KenjiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2024-11-30 03:15:55 +0900Updated at: 2024-12-01 03:16:03 +0900
