Cross sectional CL study of the growth and annihilation of pit type defects in HVPE grown (0001) thick GaN | SAMURAI, NIMS Researchers Directory Service

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Cross sectional CL study of the growth and annihilation of pit type defects in HVPE grown (0001) thick GaN

W. Lee, H.J. Lee, S.H. Park, K. Watanabe, K. Kumagai, T. Yao, J.H. Chang, T. Sekiguchi.

Journal of Crystal Growth 351 [1] 83-87. 2012.

https://doi.org/10.1016/j.jcrysgro.2012.04.016

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 16:43:07 +0900Updated at: 2024-04-02 05:06:27 +0900

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