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Twins and Intergrowth Defects in High-Tc Bi-Sr-Ca-Cu-O Superconductor by High Resolution Electron Microscopy

松井良夫, 堀内繁雄, 竹川俊二, MUROMACHI, Eiji, 前田弘, 田中吉秋.
Japanese Journal of Applied Physics 827. 1988.

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