HOME > Article > DetailResistance of single polyaniline fibers and their junctions measured by double-probe atomic force microscopy(2探針AFMを用いたポリアニリン単一ファイバーおよび接合点の抵抗計測)Rintaro Higuchi, Yoshitaka Shingaya, Tomonobu Nakayama. Japanese Journal of Applied Physics 55 [8S1] 08NB09. 2016.https://doi.org/10.7567/jjap.55.08nb09 NIMS author(s)SHINGAYA, YoshitakaNAKAYAMA, TomonobuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-12-03 23:05:06 +0900Updated at: 2024-04-01 21:59:20 +0900