HOME > Article > DetailDislocation analysis of homoepitaxial diamond (001) film by x-ray topographyShinichi Shikata, Yuka Matsuyama, Tokuyuki Teraji. Japanese Journal of Applied Physics 58 [4] 045503. 2019.https://doi.org/10.7567/1347-4065/ab0541 NIMS author(s)TERAJI, TokuyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2019-05-28 03:00:23 +0900 Updated at :2020-11-16 22:14:27 +0900