HOME > Article > DetailNano-analysis by a high resolution energy filtering transimission electron microscope(高分解能エネルギーフィルター透過電子顕微鏡によるナノ解析)Masanori Mitome, Yoshio Bando, Dmitri Golberg, Keiji Kurashima, Yoshihiro Okura, Toshikatsu Kaneyama, Mikio Naruse, Yoshiaki Honda. Microscopy Research and Technique 63 [3] 140-148. 2004.https://doi.org/10.1002/jemt.20025 NIMS author(s)MITOME, MasanoriBANDO, YoshioGOLBERG, DmitriKURASHIMA, KeijiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:58:16 +0900Updated at: 2024-04-01 20:20:07 +0900