SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Extraction of Depth Distributions of Electron-excited Auger Electrons in Fe,Ni and Si Using Inelastic Peak-shape Analysis
(非弾性散乱電子ピーク形状解析によるFe,Ni,Siでの電子線励起オージェ電子の深さ方向分布の抽出)

D. Fujita, M.Schleberger, S.Tougaard, M. Schleberger, S. Tougaard.
Surface Science 357-358 180-185. 1996.
https://doi.org/10.1016/0039-6028(96)00085-4

NIMS author(s)

    Fulltext and dataset(s) on Materials Data Repository (MDR)

      Created at: 2016-05-24 11:36:20 +0900 Updated at: 2026-06-28 05:16:24 +0900

      ▲ Go to the top of this page