Distinguishing dislocation densities in intrinsic layers of pin diamond diodes using two photon-excited photoluminescence imaging

Tatsuya Honbu; Daisuke Takeuchi; Kimiyoshi Ichikawa; Shinya Ohmagari; Tokuyuki Teraji; Masahiko Ogura; Hiromitsu Kato; Toshiharu Makino; Ichiro Shoji; Tatsuya Honbu; Daisuke Takeuchi; Kimiyoshi Ichikawa; Shinya Ohmagari; Tokuyuki Teraji; Masahiko Ogura; Hiromitsu Kato; Toshiharu Makino; Ichiro Shoji

doi:10.1016/j.diamond.2021.108463

Distinguishing dislocation densities in intrinsic layers of pin diamond diodes using two photon-excited photoluminescence imaging

Tatsuya Honbu, Daisuke Takeuchi, Kimiyoshi Ichikawa, Shinya Ohmagari, Tokuyuki Teraji, Masahiko Ogura, Hiromitsu Kato, Toshiharu Makino, Ichiro Shoji.

Diamond and Related Materials 117 108463. 2021.

https://doi.org/10.1016/j.diamond.2021.108463

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2021-12-15 03:37:25 +0900Updated at: 2024-08-10 06:51:51 +0900