International Round Robin Test for Critical Current Measurement of RE-Ba-Cu-O Superconducting Tapes

Gen Nishijima; Kozo Osamura; Tatsuoki Nagaishi; Toru Fukushima; Yasuhiro Iijima; Tsutomu Koizumi; Yifei Zhang; Marco Breschi; Xavier Chaud; Hyung-Seop Shin; Takanobu Kiss; Gen Nishijima; Kozo Osamura; Tatsuoki Nagaishi; Toru Fukushima; Yasuhiro Iijima; Tsutomu Koizumi; Yifei Zhang; Marco Breschi; Xavier Chaud; Hyung-Seop Shin; Takanobu Kiss

doi:10.1109/tasc.2018.2801329

International Round Robin Test for Critical Current Measurement of RE-Ba-Cu-O Superconducting Tapes

Gen Nishijima, Kozo Osamura, Tatsuoki Nagaishi, Toru Fukushima, Yasuhiro Iijima, Tsutomu Koizumi, Yifei Zhang, Marco Breschi, Xavier Chaud, Hyung-Seop Shin, Takanobu Kiss.

IEEE Transactions on Applied Superconductivity 28 [4] 1-5. 2018.

https://doi.org/10.1109/tasc.2018.2801329

NIMS author(s)

NISHIJIMA, Gen

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2018-04-05 21:09:42 +0900Updated at: 2024-03-30 02:31:20 +0900