HOME > Article > Detail原子間力顕微鏡を使った超精密測定:単原子から高分子まで(High-resolution force measurement with atomic force microscopy)川井 茂樹. 固体物理 52 [6] 297-309. 2017.NIMS author(s)KAWAI, ShigekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-10-12 21:13:46 +0900Updated at: 2018-06-15 22:00:12 +0900