HOME > Article > DetailInvestigation of Ag and Cu Filament Formation Inside the Metal Sulfide Layer of an Atomic Switch Based on Point-Contact SpectroscopyA. Aiba, R. Koizumi, T. Tsuruoka, K. Terabe, K. Tsukagoshi, S. Kaneko, S. Fujii, T. Nishino, M. Kiguchi. ACS Applied Materials & Interfaces 11 [30] 27178-27182. 2019.https://doi.org/10.1021/acsami.9b05523 NIMS author(s)TSURUOKA, TohruTERABE, KazuyaTSUKAGOSHI, KazuhitoFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2019-08-06 03:00:19 +0900 Updated at :2020-11-16 22:10:12 +0900