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Investigation of Ag and Cu Filament Formation Inside the Metal Sulfide Layer of an Atomic Switch Based on Point-Contact Spectroscopy

A. Aiba, R. Koizumi, T. Tsuruoka, K. Terabe, K. Tsukagoshi, S. Kaneko, S. Fujii, T. Nishino, M. Kiguchi.
ACS Applied Materials & Interfaces 11 [30] 27178-27182. 2019.

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    Created at :2019-08-06 03:00:19 +0900 Updated at :2020-11-16 22:10:12 +0900

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