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Evidence for Defect-Mediated Tunneling in Hexagonal Boron Nitride-Based Junctions

U. Chandni, K. Watanabe, T. Taniguchi, J. P. Eisenstein.
Nano Letters 15 [11] 7329-7333. 2015.
https://doi.org/10.1021/acs.nanolett.5b02625

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