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Comparison between cathodoluminescence spectroscopy and capacitance transient spectroscopy on Al+ ion implanted 4H-SiC p+/n diodes

F.Fabbri, D. Natalini, Anna Cavallini, SEKIGUCHI, Takashi, R. Nipoti, F. Moscatelli.

NIMS author(s)


    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2022-10-21 23:32:26 +0900 Updated at: 2022-10-21 23:32:26 +0900

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