極低バイアス走査トンネル顕微鏡による低次元表面観察
(Characterization of Low Dimensional Surface with Ultra-low Bias Scanning Tunneling Microscopy)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 11:52:08 +0900 Updated at: 2018-05-30 17:53:01 +0900