Measurement of work function change with surface segregation of substrate element on a deposited film
(基板元素の偏析がみられる薄膜表面における仕事関数の変化)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 11:39:42 +0900Updated at: 2025-03-12 04:14:02 +0900