HOME > Article > DetailIn situ voltage-application system for active voltage contrast imaging in helium ion microscope(ヘリウムイオン顕微鏡におけるアクティブ電圧コントラスト画像化のためのin situ電圧印加機構)Chikako Sakai, Nobuyuki Ishida, Shoko Nagano, Keiko Onishi, Daisuke Fujita. Journal of Vacuum Science & Technology B 36 [4] 042903. 2018.https://doi.org/10.1116/1.5031086 NIMS author(s)ISHIDA, NobuyukiNAGANO, ShokoONISHI, KeikoFUJITA, DaisukeFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-07-28 15:12:26 +0900Updated at: 2024-03-29 23:14:52 +0900