HOME > Article > DetailSF6 as sputtering gas for high resolution depth profilingA.Rar, S.Hofmam(Max-Plank-Institut). Apploed Surface Science . .NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-11-15 00:39:26 +0900 Updated at: 2022-11-15 00:39:26 +0900