Combining advanced photoelectron spectroscopy approaches to analyse deeply buried GaP(As)/Si(1 0 0) interfaces: Interfacial chemical states and complete band energy diagrams

O. Romanyuk; A. Paszuk; I. Gordeev; R.G. Wilks; S. Ueda; C. Hartmann; R. Félix; M. Bär; C. Schlueter; A. Gloskovskii; I. Bartoš; M. Nandy; J. Houdková; P. Jiříček; W. Jaegermann; J.P. Hofmann; T. Hannappel; O. Romanyuk; A. Paszuk; I. Gordeev; R.G. Wilks; S. Ueda; C. Hartmann; R. Félix; M. Bär; C. Schlueter; A. Gloskovskii; I. Bartoš; M. Nandy; J. Houdková; P. Jiříček; W. Jaegermann; J.P. Hofmann; T. Hannappel

doi:10.1016/j.apsusc.2022.154630

Combining advanced photoelectron spectroscopy approaches to analyse deeply buried GaP(As)/Si(1 0 0) interfaces: Interfacial chemical states and complete band energy diagrams

O. Romanyuk, A. Paszuk, I. Gordeev, R.G. Wilks, S. Ueda, C. Hartmann, R. Félix, M. Bär, C. Schlueter, A. Gloskovskii, I. Bartoš, M. Nandy, J. Houdková, P. Jiříček, W. Jaegermann, J.P. Hofmann, T. Hannappel.

Applied Surface Science 605 154630. 2022.

https://doi.org/10.1016/j.apsusc.2022.154630

NIMS author(s)

UEDA, Shigenori

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-09-14 03:18:41 +0900Updated at: 2025-01-09 08:40:44 +0900