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Ion tracks in silicon formed by much lower energy deposition than the track formation threshold

H. Amekura, M. Toulemonde, K. Narumi, R. Li, A. Chiba, Y. Hirano, K. Yamada, S. Yamamoto, N. Ishikawa, N. Okubo, Y. Saitoh.
Scientific Reports 11 [1] 185. 2021.
https://doi.org/10.1038/s41598-020-80360-8
Open Access Springer Science and Business Media LLC (Publisher)

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    Created at: 2021-01-28 03:00:17 +0900 Updated at: 2026-06-26 07:39:09 +0900

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