SAMURAI - NIMS Researchers Database

HOME > 論文 > 書誌詳細

Visualizing the Effect of an Electrostatic Gate with Angle-Resolved Photoemission Spectroscopy
(Visualizing the effect of an electrostatic gate with angle-resolved photoemission spectroscopy)

Frédéric Joucken, Jose Avila, Zhehao Ge, Eberth A. Quezada-Lopez, Hemian Yi, Romaric Le Goff, Emmanuel Baudin, John L. Davenport, Kenji Watanabe, Takashi Taniguchi, Maria Carmen Asensio, Jairo Velasco.
Nano Letters 19 [4] 2682-2687. 2019.
https://doi.org/10.1021/acs.nanolett.9b00649

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

    作成時刻: 2019-05-28 03:00:33 +0900更新時刻: 2024-03-31 01:01:37 +0900

    ▲ページトップへ移動