SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
(Fabrication of Gate-Tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities)

Han Sae Jung, Hsin-Zon Tsai, Dillon Wong, Chad Germany, Salman Kahn, Youngkyou Kim, Andrew S. Aikawa, Dhruv K. Desai, Griffin F. Rodgers, Aaron J. Bradley, Jairo Velasco, Kenji Watanabe, Takashi Taniguchi, Feng Wang, Alex Zettl, Michael F. Crommie.
Journal of Visualized Experiments [101] . 2015.
https://doi.org/10.3791/52711

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2016-05-24 17:46:57 +0900Updated at: 2024-03-31 18:39:02 +0900

    ▲ Go to the top of this page