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Transmission electron microscope as an ultimate tool for nanomaterial property studies
(ナノ材料の特性評価のための透過電子顕微鏡法)

Naoyuki Kawamoto, Dai-Ming Tang, Xianlong Wei, Xi Wang, Masanori Mitome, Yoshio Bando, Dmitri Golberg.
Microscopy 62 [1] 157-175. 2013.
https://doi.org/10.1093/jmicro/dfs078

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