TAKEGUCHI, Masaki

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Last Update : 2013/05/28
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TAKEGUCHI, Masaki
Station Director,  Transmission Electron Microscopy Station, RNFS,  National Institute for Materials Science
Email: TAKEGUCHI.Masakinims.go.jp
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047 JAPAN [Location]
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Other Affiliations
Group Leader, High Resolution Group, RNFS
Group Leader, In-situ Characterization Group, RNFS
Operation Manager, Promotion Office for Microstructural Characterization Platform, RNFS
Chief Researcher, Microstructural Characterization Platform, RNFS
Unassigned, Forefront Microscopy Group, Center for GaN Characterization and Analysis, RNFS
Publications NIMS affiliated publications since 2004.
Research papers
  • M. Takeguchi, A. Hashimoto, M. Shimojo, K. Mitsuishi, K. Furuya : “Development of a stage-scanning system for high-resolution confocal STEM” J. Electron Microsc. 57[4] (2008) 123-127
  • M. Takeguchi, M. Shimojo and K. Furuya : “Fabrication of magnetic nanostructures using electron beam induced chemical vapour deposition” Nanotechnology 16[8] (2005) 1321-1325 DOI:10.1088/0957-4484/16/8/057
  • M. Takeguchi, M. R. McCartney and D. J. Smith : “Mapping In concentration strain and internal electric field in InGaN/GaN quantum well structure” Appl. Phys. Lett. 84[12] (2004) 2103-2105 DOI:10.1063/1.1689400
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Books
  • 竹口雅樹, 田中美代子, 古屋一夫 : “超高真空電子顕微鏡による半導体表面のPdクラスターの観察” 材料開発のための顕微鏡法と応用写真集 (2006)
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Conferences
  • M. Takeguchi, M. Okuda, A. Hashimoto, K. Mitsuishi, SHIMOJO Masayuki, X. Zhang, P. W., P. N., A. I. K. : “Three dimensional characterization of a silica hollow sphere with an iron oxide core by annular dark field scanning confocal electron microscopy” Microscopy and Microanalysis 2010 MICROSCOPY AND MICROANALYSIS 16[suppl2] (2010) 1836-1837 DOI:10.1017/S143192761005885X
  • M. Takeguchi, H. Okuno, K. Mitsuishi, Y. Irokawa, Y. Sakuma, K. Furuya : “Electron Holography Observation of AlInGaN/GaN Heterointerfaces” The 9th Asia-Pacific Conference on Electron Microscopy Proceedings of The 9th Asia-Pacific Conference on Electron Microscopy (2009) 255-256
  • M. Takeguchi, A. Hashimoto, K. Mitsuishi, SHIMOJO Masayuki : “Development of annular dark field confocal scanning transmission electron microscopy” Microscopy and microanalysis 2009 MICROSCOPY AND MICROANALYSIS 15[Suppl 2] (2009) 612-613
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Presentations, others
  • June 22, 2010 : M. Takeguchi : “Confocal Electron Microscopy - Toward to imaging materials in shells cells and capsules -” In-situ TEM Symposium at NNFC
  • May 26-29, 2009 : 竹口雅樹, 橋本綾子, 三石和貴, 下条雅幸 : “円環暗視野共焦点STEMの開発” 日本顕微鏡学会 第65回学術講演会
  • Oct. 18, 2008 : 竹口雅樹, 三石和貴 : “共焦点STEMの現状と可能性” 日本顕微鏡学会第52回シンポジウム
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Patents
  • No. 2011175908 “試料ホルダおよび走査型透過電子顕微鏡” (2011)
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External references
ResearcherID.COM (No.H-2946-2011)
NIMS Researchers