MITSUISHI, Kazutaka

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Last Update : 2011/05/12
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MITSUISHI, Kazutaka
Group Leader,  In-situ Characterization Technique Development Group, RCAMC,  National Institute for Materials Science
Email: MITSUISHI.Kazutakanims.go.jp
Phone: +81-29-863-5474
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047 JAPAN [Location]
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Other Affiliations
Chief Researcher, Nanostructurral Characterization Group, RNFS
GREEN Coordinator, Nano-interface Characterization Field, C4GR-GREEN
Chief Researcher, Microstructural Characterization Platform, RNFS
Chief Researcher, All Solid State Battery Specially Promoted Research Team, C4GR-GREEN
Unassigned, Materials for Battery Open Laboratory, NIMS Open Innovation Center, EC Div.
GREEN Leader, In-situ Interface Analysis Group, Nano-interface Characterization Field, C4GR-GREEN
Group Manager, Forefront Microscopy Group, Center for GaN Characterization and Analysis, RNFS
Research fields
Keywords 2101,4901,5402
researchPicture
Convergent beam electron diffraction (CBED) pattern from GaN together with the simulated CBED pattern. The polarity of the sample and its thickness can easily determined by the comparison
Publications NIMS affiliated publications since 2004.
Research papers
  • I. Sychugov, Y. Nakayama and K. Mitsuishi : “Manifold enhancement of electron beam induced deposition rate at grazing incidence” Nanotechnology 21[2] (2010) 025303-1 DOI:10.1088/0957-4484/21/2/025303
  • A. Hashimoto, M. Shimojo, K. Mitsuishi and M. Takeguchi : “Three-Dimensional Optical Sectioning by Scanning Confocal Electron Microscopy with a Stage-Scanning System” Microsc. microanal. 16[3] (2010) 233-238 DOI:10.1017/S1431927610000127
  • P. Wang, G. Behan, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo, A. I. Kirkland and P. D. Nellist : “Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope” Phys. Rev. Lett. 104[20] (2010) 200801-1 DOI:10.1103/PhysRevLett.104.200801
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Books
  • K. Mitsuishi : “Monte Carlo Method in FEBID Process Simulations (chapter8)” Nanofaburication Using Focused Ion and Electron Beams (2012)
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Conferences
  • A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A. I.Kirkland, P. D.Nellist, M. Takeguchi : “Three-Dimensional Analysis of Nanoparticles using Annular Dark-Field Scanning Confocal Electron Microscopy Established in a Doub” The 2nd International Symposium on Advanced Microscopy and Theor AMTC Letters 2 (2010) 114-115
  • A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A. I.Kirkland, P.D. Nellist, M. Takeguchi : “Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope” Microscopy & Microanalysis 2010 Meeting MICROSCOPY AND MICROANALYSIS 16[Suppl. 2] (2010) 1888-1889 DOI:10.1017/S1431927610058022
  • X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo : “Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron Microscopy” Microscopy & Microanalysis 2010 Meeting MICROSCOPY AND MICROANALYSIS 16[Suppl. 2] (2010) 290-291 DOI:10.1017/S1431927610053870
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Presentations, others
  • Aug. 23, 2010 : 三石和貴 : “STEM像の計算手法の基礎” 電顕技術開発若手研究部会 第2回ワークショップ
  • May 23-26, 2010 : 三石和貴, 橋本綾子, 下条雅幸, 竹口雅樹, 石塚和夫 : “共焦点暗視野電子顕微鏡法の結像特性” 日本顕微鏡学会66回学術講演会
  • Oct. 30-31, 2009 : 三石和貴, 橋本綾子, 竹口雅樹, 下条雅幸, 石塚 和夫 : “共焦点走査透過電子顕微鏡法による3次元観察の可能性” 日本顕微鏡学会第53回シンポジウム
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Patents
  • No. 4250760 “ナノ樹木状構造物とその作製方法” (2009)
  • No. 3861156 “ポーラスメンブレン孔内のナノ構造体の作製方法” (2006)
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External references
ResearcherID.COM (No.H-2627-2011)
NIMS Researchers