ISHII, Masashi

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Last Update : 2016/04/02
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ISHII, Masashi
Principal Researcher,  Surface Physics and Characterization Group, RCAMC,  National Institute for Materials Science
Email: ISHII.Masashinims.go.jp
Phone: +81-29-860-4576
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047 JAPAN [Location]
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Other Affiliation
Managing Director, Center for Materials Research by Information Integration
Publications NIMS affiliated publications since 2004.
Research papers
  • 石井真史 : “「光らなかった」過程を測る” OYO BUTURI 85[3] (2016) 223-227
  • I. Masashi, A. Koizumi, Y. Fujiwara : “Three-dimensional spectrum mapping of bright emission centers: investigating the brightness-limiting process in Eu-doped GaN red light emitting diodes” Appl. Phys. Lett. 107[8] (2015) 082106-1 DOI:10.1063/1.4929531
  • I. Masashi, A. Koizumi, Y. Fujiwara : “Nanoscale determinant to brighten up GaN:Eu red LED: Local potential of Eu-defect complexes” J. Appl. Phys. 117[15] (2015) 155307-1 DOI:10.1063/1.4918662
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Conferences
  • I. Masashi, N. Ikeda, D. Tsuya, K. Sakurai : “Y2O3 Thin Film Deposited by Two-step Process and Its Resistance to Halogen Plasma” 2008 E-MRS Fall meeting Proceedings of 2008 E-MRS Symposium I (2009) 205-212
  • Matsushita, Etsuo Arakawa, Yasuhiro Niwa, Yasuhiro Inada, Tadashi Hatano, Tetsuo Harada, Yasuo Higashi, Keiichi Hirano, K. Sakurai, I. Masashi, NOMURA Masaharu : “A simultaneous multiwavelength dispersive X-ray reflectometer for time-resolved reflectometry” SXNS-10 The European Physical Journal - Special Topics 167[1] (2009) 113-120
  • I. Masashi, Aiko Nakao, K. Sakurai : “金属/酸化膜界面への化学的なデーター書き込み:低次元界面反応のI-V測定による評価” 2007 MRS Fall Meeting Mater. Res. Soc. Symp. proc. 1056E[HH11-64] (2008)
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Presentations, others
  • Dec. 08, 2009 : I. Masashi : “Photon pumped electric force microscopy of Ge quantum dots” Forthcoming PSI Workshop: Photon Probes for Nanoscience
  • Nov. 05-06, 2009 : 石井真史, B. Towlson, E. Whittaker, S. S. Dhesi, B. Hamilton : “極微構造の元素イメージングのための二光子照射による内殻励起光イオン化制御” 第45回X線分析討論会
  • Sep. 08-11, 2009 : 石井真史, Sarnjeet S. Dhesi, Bruce Hamilton : “静電気力プローブ顕微鏡による電荷移動の動的観測:SiGeドット閉込め正孔の光誘起移動” 2009年秋季 第70回 応用物理学会 学術講演会
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Patents
  • No. 2011080820 “試料表面の誘電特性測定方法と測定装置” (2011)
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External references
ResearcherID.COM (No.H-2611-2011)
NIMS Researchers