HASHIMOTO, Ayako

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Last Update : 2013/08/26
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HASHIMOTO, Ayako
Senior Researcher,  In-situ Characterization Technique Development Group, RCAMC,  National Institute for Materials Science
Email: HASHIMOTO.Ayakonims.go.jp
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047 JAPAN [Location]
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Other Affiliations
GREEN Leader, Environmental Microscopy Group, Nano-interface Characterization Field, C4GR-GREEN
Senior Researcher, Lithium Air Battery Specially Promoted Research Team, C4GR-GREEN
Senior Researcher, Nanostructurral Characterization Group, RNFS
Senior Researcher, Microstructural Characterization Platform, RNFS
Research fields
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Publications NIMS affiliated publications since 2004.
Research papers
  • M. Okuda, M. Takeguchi, O. O Ruairc, M. Tagaya, Y. Zhu, A. Hashimoto, N. Hanagata, W. Schmitt and T. Ikoma : “Structural analysis of hydroxyapatite coating on magnetite nanoparticles using energy filter imaging and electron tomography” J. Electron Microsc. 59[2] (2010) 173-179 DOI:10.1093/jmicro/dfp055
  • A. Hashimoto, M. Shimojo, K. Mitsuishi and M. Takeguchi : “Three-Dimensional Optical Sectioning by Scanning Confocal Electron Microscopy with a Stage-Scanning System” Microsc. microanal. 16[3] (2010) 233-238 DOI:10.1017/S1431927610000127
  • M. Okuda, M. Takeguchi, M. Tagaya, T. Tonegawa, A. Hashimoto, N. Hanagata and T. Ikoma : “Elemental distribution analysis of type I collagen fibrils in tilapia fish scale with energy-filtered transmission electron microscope” Micron 40[5-6] (2009) 665-668 DOI:10.1016/j.micron.2009.04.001
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Conferences
  • A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A. I.Kirkland, P. D.Nellist, M. Takeguchi : “Three-Dimensional Analysis of Nanoparticles using Annular Dark-Field Scanning Confocal Electron Microscopy Established in a Doub” The 2nd International Symposium on Advanced Microscopy and Theor AMTC Letters 2 (2010) 114-115
  • A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A. I.Kirkland, P.D. Nellist, M. Takeguchi : “Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope” Microscopy & Microanalysis 2010 Meeting MICROSCOPY AND MICROANALYSIS 16[Suppl. 2] (2010) 1888-1889 DOI:10.1017/S1431927610058022
  • X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo : “Deconvolution method used in improving the depth resolution of three-dimensional images taken by scanning confocal electron Microscopy” Microscopy & Microanalysis 2010 Meeting MICROSCOPY AND MICROANALYSIS 16[Suppl. 2] (2010) 290-291 DOI:10.1017/S1431927610053870
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Presentations, others
  • May 23-26, 2010 : 橋本綾子, 下条雅幸, 三石和貴, 竹口雅樹 : “収差補正TEM/STEMを用いた環状暗視野-共焦点STEMの開発” 日本顕微鏡学会第66回学術講演会
  • May 23-26, 2010 : X.Zhang, 竹口雅樹, 橋本綾子, 三石和貴, 下条雅幸 : “Improvement in depth resolution of scanning confocal electron microscopy” The 66th Annual Meeting of the Japanese Society of Microscopy
  • May 23-26, 2010 : 三石和貴, 橋本綾子, 下条雅幸, 竹口雅樹, 石塚和夫 : “共焦点暗視野電子顕微鏡法の結像特性” 日本顕微鏡学会66回学術講演会
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External references
ResearcherID.COM (No.H-2648-2011)
NIMS Researchers