FUKATA, Naoki

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Last Update : 2017/02/13
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FUKATA, Naoki
Group Leader,  Nanostructured Semiconducting Materials Group, MANA,  National Institute for Materials Science
Email: FUKATA.Naokinims.go.jp
Phone: +81-29-860-4769
1-1 Namiki, Tsukuba, Ibaraki, 305-0044 JAPAN [Location]
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Other Affiliation
Assistant Manager, Exective Secretariat
Publications NIMS affiliated publications since 2004.
Research papers
  • Y. YAMAUCHI, P. GUPTA, K. SATO, N. FUKATA, S. TODOROKI, S. INOUE and S. KISHIMOTO : “Industrial mass-production of mesoporous silica spherical particles by a spray-drying process: investigation of synthetic conditions” J. Ceram. Soc. Jpn. 117[1362] (2009) 198-202 DOI:10.2109/jcersj2.117.198
  • Y. Yamauchi, G. Prashant, N. Fukata, S. Keisuke : “Aerosol-assisted Fabrication of Porous Silica Spheres with a Hierarchical Pore System through Multicomponent Assembly” Chem. Lett. 38[3] (2009) 78-79 DOI:10.1246/cl.2009.78
  • Y. Yamauchi, T. Nagaura, K. Takai, N. Suzuki, K. Sato, N. Fukata, S. Inoue and S. Kishimoto : “Generation of Electron Moiré Fringes on Designed Nanoporous Anodic Alumina Films and Their Replicated Ni Cone Arrays: Exploration of Domain Sizes and Nanopore Arrangements” J. Phys. Chem. C 113[22] (2009) 9632-9637 DOI:10.1021/jp901421j
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Conferences
  • J. Chen, T. Sekiguchi, N. Fukata, M. Takase, Y. Nemoto, R. Hasunuma, K. Yamabe, M. Sato, K. Yamada, T. Chikyo : “An Electron-Beam-Induced Current Investigation of Electrical Defects in High-k Gate Stacks” 217 th ECS Meeting ECS Transcations 28[2] (2010) 299-313
  • J. Chen, T. Sekiguchi, N. Fukata, M. Takase, T. Chikyo, R. Hasunuma, K. Yamabe, M. Sato, Y. Nara, K. Yamada : “Electron Beam Induced Current Investigation of Stress-Induced Leakage and Breakdown Processes in High-k stacks” 2009 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM IEEE IRPS 2009 Proceedings (2009) 333-338
  • T. Yo, H. Tanaka, T. Nagata, N. Fukata, T. Chikyo, A. Sakai, J. Yanagisawa : “Effect of Annealing on Mechanical Properties of Materials Formed by Focused Au or Si Ion-Beam-Induced Chemical Vapor Deposition Using Phenanthrene” 21st International Microprocesses and Nanotechnology Conference JAPANESE JOURNAL OF APPLIED PHYSICS 48[6] (2009) 06FB03-1
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Presentations, others
  • Mar. 17-20, 2010 : 深田直樹, 齋藤直之, 石田 慎哉, 横野茂輝, 陳君, 関口隆史, 菱田俊一, 村上浩一 : “イオン注入によるSiナノワイヤへの不純物ドーピング” 2010年春季 第57回 応用物理学関係連合講演会
  • Mar. 17-20, 2010 : 横野茂輝, 齋藤直之, 石田 慎哉, 深田直樹, 陳君, 関口隆史, 菱田俊一, 村上浩一 : “SiナノワイヤへのO2+イオン注入効果” 2010年春季 第57回 応用物理学関係連合講演会
  • Mar. 17-20, 2010 : 石田 慎哉, 齋藤直之, 横野茂輝, 深田直樹, 陳君, 関口隆史, 菱田俊一, 村上浩一 : “SiナノワイヤへのPイオン注入” 2010年春季 第57回 応用物理学関係連合講演会
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Patents
  • No. 3777425 “ガラス材料中に誘起された構造変化のその場診断法” (2006)
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External references
ResearcherID.COM (No.H-2634-2011)
NIMS Researchers